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Figure 8
Measured (solid lines) and calculated (dashed lines) HiOS transmission for the (uncoated) Si substrates at different incidence angles. Calculation based on optical parameters obtained from fitting on test samples as indicated.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 25| Part 1| January 2018| Pages 100-107
https://doi.org/10.1107/S1600577517016800
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