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Figure 5
(a) Diagrams of the CS procedure. A FEL pulse with high intensity is employed to damage the Si3N4 surface (top, purple arrow). The scattering of an optical pulse from the crater is hence recorded by a CCD (middle and bottom). The FEL intensity is subsequently decreased (bottom, light purple arrow) and the transient scattered intensity measured. (b) Timing traces obtained with such a procedure, and an image of the scattering crater.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 25| Part 1| January 2018| Pages 44-51
https://doi.org/10.1107/S1600577517016368
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