view article
Figure 1
(a) Schematic of the experimental setup. The horizontally polarized soft X-ray pulses were one-dimensionally focused onto the GaAs wafer. The optical laser pulses were vertically polarized, which corresponded to the reflection of p-polarized pulses. The reflected beam was imaged onto the visible CCD camera. (b) Spatial profile of the incident soft X-ray FEL beam. (c) Spatial profile after the 1 mm-width slit. The white dashed circle depicts the incident beam size.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 25| Part 1| January 2018| Pages 68-71
https://doi.org/10.1107/S1600577517015284
Follow J. Synchrotron Rad.
Sign up for e-alerts
E-alerts
Follow J. Synchrotron Rad. on Twitter
Twitter
Follow us on facebook
Facebook
Sign up for RSS feeds
RSS