view article

Figure 7
Detailed EUV reflectivity scans inside and outside the l1n9 spots: (a) for Ru an angle of incidence scan at fixed wavelength of 13.5 nm and (b) for Mo/Si a wavelength scan at a fixed angle of incidence of 73.75°.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Follow J. Synchrotron Rad.
Sign up for e-alerts
Follow J. Synchrotron Rad. on Twitter
Follow us on facebook
Sign up for RSS feeds