Characterization of a submicro-X-ray fluorescence setup on the B16 beamline at Diamond Light Source

Rauwolf, M.; Turyanskaya, A.; Ingerle, D.; Szoboszlai, N.; Pape, I.; Malandain, A.W.; Fox, O.J.L.; Hahn, L.; Sawhney, K.J.S.; Streli, C.

doi:10.1107/S1600577518006203

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Figure 5
Sensitivities for the L-lines, lower limit of detections (inset table) and sum spectrum (inset) of 36 (6 × 6) pixels measured on the NIST SRM 1412 (Multicomponent Glass) with 12.7 keV monochromatic excitation.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 25| Part 4| July 2018| Pages 1189-1195

https://doi.org/10.1107/S1600577518006203

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