Defect engineering by synchrotron radiation X-rays in CeO2 nanocrystals

Wu, T.-S.; Syu, L.-Y.; Weng, S.-C.; Jeng, H.-T.; Chang, S.-L.; Soo, Y.-L.

doi:10.1107/S1600577518008184

Journal of Synchrotron Radiation Journal of
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Figure 2
(a) Ce³⁺ concentration obtained from Ce L₃-edge XANES data of samples Y1, Y2 and a 300^oC-annealed CeO₂ sample with different X-ray irradiation times. (b) Plot of the Ce³⁺ concentration versus photon energy for the as-made CeO₂ sample. (c) Plot of the Ce³⁺ concentration versus photon flux for the as-made CeO₂ sample.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 25| Part 5| September 2018| Pages 1395-1399

https://doi.org/10.1107/S1600577518008184

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