Soft X-ray refractive index by reconciling total electron yield with specular reflection: experimental determination of the optical constants of graphite

Jansing, C.; Wahab, H.; Timmers, H.; Gaupp, A.; Mertins, H.-C.

doi:10.1107/S1600577518010408

Journal of Synchrotron Radiation Journal of
Synchrotron Radiation

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Figure 6
Measured reflectance R_s and simulations for s-geometry. The simulations are discussed in the text. The inset compares data and simulations in more detail at the σ-resonance peak. (The values for ∊ are given in eV and the dependence of μ on η is indicated.)

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 25| Part 5| September 2018| Pages 1433-1443

https://doi.org/10.1107/S1600577518010408

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