Characterization and on-line adjustment of the sagittal-bent Laue crystal profile

Dong, W.; Cai, Q.; Yang, F.; Liu, X.; Yang, J.; Diao, Q.; Liu, P.; Zhang, X.; Hu, L.

doi:10.1107/S1600577518008056

Journal of Synchrotron Radiation Journal of
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Figure 10
(a) The measured centres of the dots when the CCD was placed at different positions from the first crystal. The centres fit well to a straight line which can be viewed as the light ray. (b) The extrapolated result. The image distance of this bending condition is 82 m from the DLM.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 25| Part 5| September 2018| Pages 1346-1353

https://doi.org/10.1107/S1600577518008056

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