Characterization of Pd/Y multilayers with B4C barrier layers using GIXR and X-ray standing wave enhanced HAXPES

Wu, M.-Y.; Huang, Q.-S.; Le Guen, K.; Ilakovac, V.; Li, B.-X.; Wang, Z.-S.; Giglia, A.; Rueff, J.-P.; Jonnard, P.

doi:10.1107/S1600577518009402

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Figure 2
Measured (red dots) and fitted (blue lines) GIXR curves of the multilayers (logarithm scale). (a) Sample 1 (Pd/Y). (b) Sample 2 (B₄C/Pd/B₄C/Y). (c) Sample 3 (B₄C/Pd/Y). (d) Sample 4 (Pd/B₄C/Y). The dotted line in (a) presents the calculated reflectance of the original design without interface roughness or interdiffusion.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 25| Part 5| September 2018| Pages 1417-1424

https://doi.org/10.1107/S1600577518009402

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