Figure 2
(a) Total structure factors F(Q) and (b) total correlation function T(r) of amorphous silica obtained on BL04B2 and BL08W using the FPD (1 min), compared with those obtained on BL04B2 using point detectors (3 h). Fourier transforms were carried out for the data for a constant Qmax = 26 Å−1 using the Lorch function (Lorch, 1969). A fit to the first Si—O peak in the X-ray correlation function (Mozzi & Warren, 1969) is also shown by the red dashed line. |