A new diffractometer for diffuse scattering studies on the ID28 beamline at the ESRF

Girard, A.; Nguyen-Thanh, T.; Souliou, S.M.; Stekiel, M.; Morgenroth, W.; Paolasini, L.; Minelli, A.; Gambetti, D.; Winkler, B.; Bosak, A.

doi:10.1107/S1600577518016132

Journal of Synchrotron Radiation Journal of
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Figure 4
(a) The alum structure as refined from SHELX sofware. (b) F_c versus F_o plot, where F_c and F_o are the calculated and experimental intensities, respectively. Each dot represents one measured reflection.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 26| Part 1| January 2019| Pages 272-279

https://doi.org/10.1107/S1600577518016132

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