Deducing density and strength of nanocrystalline Ta and diamond under extreme conditions from X-ray diffraction

Zhang, Y.Y.; Tang, M.X.; Cai, Y.; E, J.C.; Luo, S.N.

doi:10.1107/S1600577518017216

Journal of Synchrotron Radiation Journal of
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Figure 7
(a) Simulated X-ray spectrum from a typical APS undulator source (U18Gap13), through a 1 mm × 1 mm pinhole located 35 m away from the source. U18Gap13: undulator with a period of 18 mm and a gap of 13 mm; electron energy is 7 GeV and the current is 100 mA. The spectral flux is normalized by the peak value. (b) Gaussian-shaped spectrum (8% bandwidth). Both spectra peak at 0.5604 Å.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 26| Part 2| March 2019| Pages 413-421

https://doi.org/10.1107/S1600577518017216

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