view article
Figure 4
The simulated N K-edge XANES spectra for N incorporated at the SiO2/SiC interface [in Fig. 3[link](a)–3(e)] along with that of bulk α-Si3N4 (bottom). For comparison, the measured spectra for N-containing SiO2/SiC samples are also depicted. The measured spectra were normalized after the backgrounds were subtracted, and were shifted in energy with reference to silicon nitride.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 26| Part 2| March 2019| Pages 462-466
https://doi.org/10.1107/S1600577519001504
Follow J. Synchrotron Rad.
Sign up for e-alerts
E-alerts
Follow J. Synchrotron Rad. on Twitter
Twitter
Follow us on facebook
Facebook
Sign up for RSS feeds
RSS