The Nanodiffraction beamline ID01/ESRF: a microscope for imaging strain and structure

Leake, S.J.; Chahine, G.A.; Djazouli, H.; Zhou, T.; Richter, C.; Hilhorst, J.; Petit, L.; Richard, M.-I.; Morawe, C.; Barrett, R.; Zhang, L.; Homs-Regojo, R.A.; Favre-Nicolin, V.; Boesecke, P.; Schülli, T.U.

doi:10.1107/S160057751900078X

Journal of Synchrotron Radiation Journal of
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Figure 4
(a) Absolute flux measurement through a small aperture using a monochromatic beam with a Maxipix detector. (b) Bandpass characterization of the Si(111) monochromator at 8 keV.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 26| Part 2| March 2019| Pages 571-584

https://doi.org/10.1107/S160057751900078X

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