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Figure 6
Reflectivity of the 2.0 nm and the 2.5 nm multilayer monochromator analysed with a Cu Kα laboratory source.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 26| Part 2| March 2019| Pages 571-584
https://doi.org/10.1107/S160057751900078X
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