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Figure 8
Computer-aided design image (a) and schematic (b) of the diffractometer and sample stack at the nano-focus endstation. (c) All available sample degrees of freedom (red: typical for user experiments).

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 26| Part 2| March 2019| Pages 571-584
https://doi.org/10.1107/S160057751900078X
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