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Figure 2
Demonstrated performance of the XFEL focus at 10 keV photon energy. Examples of focused profiles measured with the wire-scan technique at the sample position in (a) the horizontal and (b) the vertical directions, respectively, using 24 layers of R = 500 µm lenses. The spot sizes are 4–5 µm FWHM. (c) Spot-size dependences on the number of CRLs with radii of curvature of 500 µm. (d) Offsets of the focused beam position relative to the case with 24 layers of CRLs. The offsets are shown normalized with the beam size. Error bars in (c) and (d) represent scan-to-scan fluctuations.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 26| Part 2| March 2019| Pages 585-594
https://doi.org/10.1107/S1600577519000882
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