FORTE – a multipurpose high-vacuum diffractometer for tender X-ray diffraction and spectroscopy at the SIRIUS beamline of Synchrotron SOLEIL

Ciatto, G.; Aubert, N.; Lecroard, M.; Engblom, C.; Fontaine, P.; Dubuisson, J.-M.; Abiven, Y.-M.; Janolin, P.-E.; Kiat, J.-M.; Dumont, Y.; Berini, B.; Fouchet, A.; Keller, N.

doi:10.1107/S1600577519003722

Journal of Synchrotron Radiation Journal of
Synchrotron Radiation

IUCr IT WDC

home archive editors for authors for readers submit open access

view article

Figure 12
(a) XRR curve in the vicinity of the P K-edge taken on an ODPA monolayer deposited on Si substrate. (b) P K-edge GI-XAS spectrum of the same sample taken in fluorescence mode with the SDD; the inset shows a fluorescence spectrum taken at 2.3 keV in GI, where it is possible to discriminate the P Kα peak from the Si Kα and elastic peaks.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 26| Part 4| July 2019| Pages 1374-1387

https://doi.org/10.1107/S1600577519003722

Follow J. Synchrotron Rad.

Search IUCr Journals		doi		Advanced search
Author		volume	page