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Figure 2
Experimental setup. (a) Schematic drawing of the MF instrument, where the MF is provided by a pair of permanent magnets mounted on a supporting rod. (b) The instrument is installed at the SSRF 19U2 beamline. The MF at the sample position is horizontal and perpendicular to the incidence X-ray beam. (c) The MF strength is controlled by adjusting the distance between the ring magnets. The analytical formula [MF = (0.012d2 − 4.71d) + 502.13] is obtained by non-linear fitting (R2 = 0.9990).

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