Figure 5
(a)–(b) Confocal overview as well as combined confocal and STED micrographs of two sample ROIs. The quality of the STED micrograph of (b) allows to track the most significant filaments as found by the so-called filament sensor (Eltzner et al., 2015), see inset (blue lines). Scale bar: 10 µm. (c) CTF-based phase reconstruction of X-ray holograms recorded at a single distance. The area shown results from a 4 × 4 stitch of holograms recorded at different lateral positions on the sample area. Scale bar: 10 µm. |