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Figure 3
Polarization-dependent NEXAFS spectra of ZnPc layers on Si deposited at substrate temperatures TS = 30, 90, 150°C and measured under incidence angles θ = 20°, 45°, 70°, 90°. All spectra were mathematically described by the same set of independent and shared parameters (coloured solid lines). For comparison the individual graphs have been scaled to equalize I0 of all carbon edges (black CDF curves).

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