Hard X-ray self-seeding commissioning at PAL-XFEL

Min, C.-K.; Nam, I.; Yang, H.; Kim, G.; Shim, C.H.; Ko, J.H.; Cho, M.-H.; Heo, H.; Oh, B.; Suh, Y.J.; Kim, M.J.; Na, D.; Kim, C.; Kim, Y.; Chun, S.H.; Lee, J.H.; Kim, J.; Kim, S.; Eom, I.; Kim, S.N.; Koo, T.-Y.; Rah, S.; Shvyd'ko, Y.; Shu, D.; Kim, K.-J.; Terentyev, S.; Blank, V.; Kang, H.-S.

doi:10.1107/S1600577519005460

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Figure 10
The self-seeded FEL intensity in FEL simulation (a) and the FEL intensity over a 1 eV bandwidth in experiments (b) as a function of the electron-energy detuning. The RMS widths for Gaussian fittings are 3.2 ×10^{- 4} for the simulation and 2.4 ×10^{- 4} for the experiment.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 26| Part 4| July 2019| Pages 1101-1109

https://doi.org/10.1107/S1600577519005460

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