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Figure 3
(a) Identification of the offset angles of the C*[100] crystal based on Bragg reflection loss measurements using undulator radiation and a Si DCM. (b, c) Pitch- and yaw-angle offsets identified near normal incidence. (d,  e) The roll-angle offset obtained from the comparison between the theoretical model and experiments at two different yaw angles. Three offset angles (θ, ψ, φ) = (0.055°, 0.63°, −1.43°) were obtained.

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