Figure 3
(a) Identification of the offset angles of the C*[100] crystal based on Bragg reflection loss measurements using undulator radiation and a Si DCM. (b, c) Pitch- and yaw-angle offsets identified near normal incidence. (d, e) The roll-angle offset obtained from the comparison between the theoretical model and experiments at two different yaw angles. Three offset angles (θ, ψ, φ) = (0.055°, 0.63°, −1.43°) were obtained. |