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![[Figure 2]](ay5536fig2mag.jpg)
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Figure 2
Reflecto-interferograms from Si3N4 membranes with thicknesses of (a) 200 nm, (b) 500 nm and (c) 1000 nm. The 100 µm scale corresponds to 224 µrad. |
![[Figure 2]](ay5536fig2.jpg)
 | JOURNAL OF SYNCHROTRON RADIATION |
ISSN: 1600-5775
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Figure 2
Reflecto-interferograms from Si3N4 membranes with thicknesses of (a) 200 nm, (b) 500 nm and (c) 1000 nm. The 100 µm scale corresponds to 224 µrad. |
| JOURNAL OF SYNCHROTRON RADIATION |
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