X-ray reflecto-interferometer based on compound refractive lenses

Lyatun, S.; Zverev, D.; Ershov, P.; Lyatun, I.; Konovalov, O.; Snigireva, I.; Snigirev, A.

doi:10.1107/S1600577519007896

Journal of Synchrotron Radiation Journal of
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Figure 3
(a) Interference patterns registered for a 200 nm membrane at different inclination angles with 14.4 keV X-rays. The 200 µm scale corresponds to 448 µrad. (b) The experimental reflectivity curve obtained by combining interferograms recorded at membrane inclination angles from 2.4 mrad to 5.6 mrad.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 26| Part 5| September 2019| Pages 1572-1581

https://doi.org/10.1107/S1600577519007896

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