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Figure 2
Determination of damage threshold by irradiating the soft XFEL pulses. (a) Schematic of the experimental setup. Multiple positions on the nickel-coated substrate were irradiated by 10 000 shots of soft XFEL pulses with different average intensity. (b) Damage threshold plotted as a function of the glancing incident angle. Filled circles are experimentally determined values and the solid line is a calculated curve for the single-shot damage threshold. The error bars are the ±2σ of the fluence fluctuation of the incident soft XFEL pulses. The dashed line indicates an estimated fluence value (0.26 × 10−3 µJ µm−2) when the soft XFEL beam (200 µJ, diameter 1 mm) irradiates the surface.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 26| Part 5| September 2019| Pages 1406-1411
https://doi.org/10.1107/S1600577519007057
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