Intense sub-micrometre focusing of soft X-ray free-electron laser beyond 1016 W cm−2 with an ellipsoidal mirror

Motoyama, H.; Owada, S.; Yamaguchi, G.; Kume, T.; Egawa, S.; Tono, K.; Inubushi, Y.; Koyama, T.; Yabashi, M.; Ohashi, H.; Mimura, H.

doi:10.1107/S1600577519007057

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Figure 3
Intensity profile of the focused soft XFEL pulses measured at photon energies of 100 eV in (a) the vertical and (b) the horizontal direction, and 120 eV in (c) the vertical and (d) the horizontal direction. The circular dots are experimentally obtained data; the solid line is a fitted curve with Gaussian function.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 26| Part 5| September 2019| Pages 1406-1411

https://doi.org/10.1107/S1600577519007057

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