Intense sub-micrometre focusing of soft X-ray free-electron laser beyond 1016 W cm−2 with an ellipsoidal mirror

Motoyama, H.; Owada, S.; Yamaguchi, G.; Kume, T.; Egawa, S.; Tono, K.; Inubushi, Y.; Koyama, T.; Yabashi, M.; Ohashi, H.; Mimura, H.

doi:10.1107/S1600577519007057

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Figure 4
Saturable absorption of an Si₃N₄ membrane induced by a focused soft XFEL pulse. (a) Schematic of the experimental setup. The single nano-focused soft XFEL pulse was focused on the 150 nm-thick Si₃N₄ membrane. The intensity of the transparent light was measured using a photodiode. (b) Transmission of the nano-focused beam plotted as a function of the intensity for 120 eV.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 26| Part 5| September 2019| Pages 1406-1411

https://doi.org/10.1107/S1600577519007057

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