Fast identification of mineral inclusions in diamond at GSECARS using synchrotron X-ray microtomography, radiography and diffraction

Wenz, M. D.; Jacobsen, S. D.; Zhang, D.; Regier, M.; Bausch, H. J.; Dera, P. K.; Rivers, M.; Eng, P.; Shirey, S. B.; Pearson, D. G.

doi:10.1107/S1600577519006854

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Figure 3
(a) Tomographic slice of diamond 6b_24 exhibiting multiple cracks. (b) Tomographic slice of diamond 6b_09 with a high-absorbing goethite inclusion, FeOOH. (c) Tomographic slice of diamond 6b_56 with a less absorbing silicate inclusion olivine, (Mg,Fe)₂SiO₄.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 26| Part 5| September 2019| Pages 1763-1768

https://doi.org/10.1107/S1600577519006854

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