Simultaneous scanning near-field optical and X-ray diffraction microscopy for correlative nanoscale structure–property characterization

Li, Q.; Marks, S.D.; Bean, S.; Fisher, M.; Walko, D.A.; DiChiara, A.D.; Chen, X.; Imura, K.; Sato, N.K.; Liu, M.; Evans, P.G.; Wen, H.

doi:10.1107/S1600577519008609

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Figure 1
Schematic of the XSNOM. The main components are (1) synchrotron X-ray beam, (2) FZP, (3) OSA, (4) probe tip, (5) parabolic mirror, (6) mid-IR detector, (7) X-ray area detector, (8) vibrating mirror, (9) beam splitter, (10) mid-IR laser beam, (11) optical fiber and (12) xyz piezo scanner.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 26| Part 5| September 2019| Pages 1790-1796

https://doi.org/10.1107/S1600577519008609

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