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Figure 5
(a) Mid-IR near-field scattering amplitude (S2) and (b) total X-ray diffraction intensity from the tip-pressure-written pattern in SmS. The region within the dashed box is separated into X-ray diffraction contributions from (c) the induced phase and (d) the pristine phase, and correlated to the corresponding section of the SNOM map in (a). The color bars in (a–d) show the normalized intensity. A positive correlation (e) exists between the SNOM amplitude and the X-ray intensity from the induced phase, while a corresponding negative correlation (f) arises from the un-transformed region.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 26| Part 5| September 2019| Pages 1790-1796
https://doi.org/10.1107/S1600577519008609
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