Overcoming the challenges of high-energy X-ray ptychography

da Silva, J.C.; Guilloud, C.; Hignette, O.; Jarnias, C.; Ponchut, C.; Ruat, M.; Labiche, J.-C.; Pacureanu, A.; Yang, Y.; Salome, M.; Bohic, S.; Cloetens, P.

doi:10.1107/S1600577519006301

Journal of Synchrotron Radiation Journal of
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Figure 7
Ptychographic imaging of a 200 nm-thick gold lithography structure of a Siemens star at 17 keV. (a) Phase contrast image (rad). (b) Amplitude contrast image (a.u.). (c)–(e) Retrieved beam at the sample position decomposed in three orthogonal modes. The power percentage of the individual modes is indicated on the top right side of each image. The brightness represents the amplitude and the hue represents the phase.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 26| Part 5| September 2019| Pages 1751-1762

https://doi.org/10.1107/S1600577519006301

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