Overcoming the challenges of high-energy X-ray ptychography

da Silva, J.C.; Guilloud, C.; Hignette, O.; Jarnias, C.; Ponchut, C.; Ruat, M.; Labiche, J.-C.; Pacureanu, A.; Yang, Y.; Salome, M.; Bohic, S.; Cloetens, P.

doi:10.1107/S1600577519006301

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Figure 8
Ptychographic imaging of the Siemens star at 33.6 keV. (a) Phase contrast image (rad). (b) Amplitude contrast image (a.u.). (c)–(g) Retrieved beam at the sample position decomposed in five orthogonal modes. The power percentage of the individual modes is indicated on the top right side of each image. The brightness represents the amplitude and the hue represents the phase.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 26| Part 5| September 2019| Pages 1751-1762

https://doi.org/10.1107/S1600577519006301

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