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Figure 9
Flat-field correction of a ptychographic diffraction pattern acquired with the GaAs sensor MAXIPIX detector of 256 × 256 pixels and pixel size of 55 µm. (a) Before correction. (b) After correction. The intensity is shown on logarithmic scale. The yellow arrows indicate the position of defects in the flat-field of the detector that were very well corrected. Zoomed-in regions of the central area of the diffraction patterns are displayed at the right of each figure.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 26| Part 5| September 2019| Pages 1751-1762
https://doi.org/10.1107/S1600577519006301
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