view article

Figure 3
(a) Comparison of scattering patterns for the CoOx-Bi thin-film catalyst. The red line trace shows the scattering pattern measured as an ∼1 µm film supported on a planar ITO glass electrode in air using a 3 mm sample film path length with the grazing-incidence geometry sketched in part (b). The blue line trace shows a portion of the 59 keV scattering pattern measured for the CoOx-Bi powder sample in a 1 mm-diameter polyimide tube. (b) Grazing-incidence scattering geometry used for ITO-supported CoOx-Bi OEC thin-film measurements, using an ∼15 µm vertically focused 23 keV X-ray beam.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Follow J. Synchrotron Rad.
Sign up for e-alerts
Follow J. Synchrotron Rad. on Twitter
Follow us on facebook
Sign up for RSS feeds