Microfluidic electrochemical cell for in situ structural characterization of amorphous thin-film catalysts using high-energy X-ray scattering

Kwon, G.; Cho, Y.-H.; Kim, K.-B.; Emery, J.D.; Kim, I.S.; Zhang, X.; Martinson, A.B.F.; Tiede, D.M.

doi:10.1107/S1600577519007240

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Figure 6
Comparison of HEXS (59 keV) patterns for (a) CoO_x-Bi and (b) CoO_x-Pi measured as ITO/GCA supported films (red traces) and as powder samples (blue traces) scraped from planar ITO electrodes and collected in 1 mm-diameter polyimide tubes.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 26| Part 5| September 2019| Pages 1600-1611

https://doi.org/10.1107/S1600577519007240

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