view article

Figure 4
(a) Distribution of phase shift converted from the surface morphology on the crystal measured with an optical microscope. The dashed circle shows an expected footprint of the XFEL beam with a diameter of 50 µm. Scale bar represents 20 µm. (b) Simulated gain curves in the reflection self-seeding using a seed without (solid line) and with (dashed line) the phase modulation. The electron beam energy is 7.8 GeV with K = 2.1015 (Eph = 10 keV). The inset of (b) shows an example of the spectrum at a distance z = 91.1 m. Spatial profiles of the XFEL beam at (c) z = 48.0 m (just downstream of the bandpass filter), (d) z = 54.2 m, where the seed pulse starts interacting with the electron bunch, and (e) z = 91.1 m. Scale bar represents 50 µm.

Journal logoJOURNAL OF
ISSN: 1600-5775
Follow J. Synchrotron Rad.
Sign up for e-alerts
Follow J. Synchrotron Rad. on Twitter
Follow us on facebook
Sign up for RSS feeds