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Figure 5
X-ray diffraction of the interface region between silicon with (a) Ti/Ni/Au deposition/SnBiCu and (b) Ti/Ni/Cu deposition/SnBiCu.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 26| Part 5| September 2019| Pages 1565-1571
https://doi.org/10.1107/S1600577519008191
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