X-ray photon diagnostics at the European XFEL

Grünert, J.; Carbonell, M.P.; Dietrich, F.; Falk, T.; Freund, W.; Koch, A.; Kujala, N.; Laksman, J.; Liu J.; Maltezopoulos, T.; Tiedtke, K.; Jastrow, U.F.; Sorokin, A.; Syresin, E.; Grebentsov, A.; Brovko, O.

doi:10.1107/S1600577519006611

Journal of Synchrotron Radiation Journal of
Synchrotron Radiation

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Figure 4
XGM measurements during a material test with high pulse intensity (∼4 mJ per pulse) and long pulse trains (300 pulses per train): average per pulse intensity based on the slow absolute calibrated ion signal (top graph); intra-train pulse-resolved intensity based on the fast ADC signal (bottom graph).

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 26| Part 5| September 2019| Pages 1422-1431

https://doi.org/10.1107/S1600577519006611

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