Scientific instrument Femtosecond X-ray Experiments (FXE): instrumentation and baseline experimental capabilities

Galler, A.; Gawelda, W.; Biednov, M.; Bomer, C.; Britz, A.; Brockhauser, S.; Choi, T.-K.; Diez, M.; Frankenberger, P.; French, M.; Görries, D.; Hart, M.; Hauf, S.; Khakhulin, D.; Knoll, M.; Korsch, T.; Kubicek, K.; Kuster, M.; Lang, P.; Alves Lima, F.; Otte, F.; Schulz, S.; Zalden, P.; Bressler, C.

doi:10.1107/S1600577519006647

Journal of Synchrotron Radiation Journal of
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Figure 7
(Left) Calculated separation between the main beam and the +1st and −1st diffracted beams at the position of BIU1 as a function of the X-ray energy for the two different grating pitches currently installed at FXE. Right: image of the 0th, 1st and −1st X-ray beam diffracted by one of the 150 nm-pitch diamond gratings as seen by BIU1.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 26| Part 5| September 2019| Pages 1432-1447

https://doi.org/10.1107/S1600577519006647

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