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Figure 3
The computed PSF after the propagation through two mirrors at three different energies from a deterministic profile error plus a high-frequency roughness profile (Raimondi & Spiga, 2015BB18). In UV light, the aperture diffraction is the dominant term. At 0.4 keV, the PSF is solely affected by the profile error imparted to the mirror. For hard X-rays, the X-ray scattering from roughness has a major impact on the PSF.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 26| Part 5| September 2019| Pages 1462-1472
https://doi.org/10.1107/S1600577519007938
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