Mapping data between sample and detector conjugated spaces in Bragg coherent diffraction imaging

Yang, D.; Phillips, N.W.; Hofmann, F.

doi:10.1107/S160057751901302X

Journal of Synchrotron Radiation Journal of
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Figure 6
Comparison between (a) the calculated SS shape from the $[(\bar{1}10)]$ reflection and (b) an electron micrograph of the sample. Excellent overlap between the calculated SS shape and the SEM micrograph is shown in (c). The unique shape of this object inspires confidence in the orientation of the object and thus in the faithfulness of the rotations applied to recover the SS object. The scale bar in SS corresponds to 200 nm.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 26| Part 6| November 2019| Pages 2055-2063

https://doi.org/10.1107/S160057751901302X

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