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Figure 7
Comparison between calculated SS shapes from two different reflections, [(\bar{1}\bar{1}0)] and [(\bar{1}10)], displayed for the x–y, x–z and y–z planes from left to right for a tungsten strain-microscopy sample. The 99.8% amplitude agreement overlap highlights the accuracy of the scripts in a laboratory-based experiment. The scale bar in SS corresponds to 200 nm.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 26| Part 6| November 2019| Pages 2055-2063
https://doi.org/10.1107/S160057751901302X
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