A hierarchical approach for modeling X-ray beamlines: application to a coherent beamline

Sanchez del Rio, M.; Celestre, R.; Glass, M.; Pirro, G.; Herrera, J.R.; Barrett, R.; da Silva, J.C.; Cloetens, P.; Shi, X.; Rebuffi, L.

doi:10.1107/S160057751901213X

Journal of Synchrotron Radiation Journal of
Synchrotron Radiation

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Figure 13
Error height profiles used for the simulations (left) and power spectral density (right) for the ML (top row), the KB vertical focusing mirror (central row), and the KB horizontal focusing mirror (bottom row).

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 26| Part 6| November 2019| Pages 1887-1901

https://doi.org/10.1107/S160057751901213X

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