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Figure 9
Setup for angular scans and offset determination. The primary beam enters from the left side through the entrance slit. The incoming intensity is detected by ion chamber IC 0, the beam after the test crystal by IC 1 and a 2D X-ray camera. The red arrows show the alignment possibilities for the test crystal, which is mounted inside the blue housing.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 26| Part 6| November 2019| Pages 1879-1886
https://doi.org/10.1107/S1600577519011123
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