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Figure 3
Diffraction profiles of the Si(111) reflection in the Bragg (dashed line) and Laue (dotted line) geometry and in the Si(440) Bragg reflection (solid line).

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 26| Part 6| November 2019| Pages 1863-1871
https://doi.org/10.1107/S1600577519010658
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