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Figure 1
Beamline layout. Apparatus from right to left: (a) APS undulator A (3.3 cm period), (b) main beam-defining slit (0.6 mm × 0.6 mm), (c) Rh-coated (10 nm-thick) water-cooled Si mirror, (d) seven-stack Be compound refractive lenses of 200 µm radius of curvature, (e) HPLC-backed liquid jet sample, (f) von Hamos crystal spectrometer, and (g) Pilatus 100K detector. The beam profiles are simulations by ray-tracing software McXtrace. Note that the scale for the focused beam plot is an order of magnitude smaller.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 26| Part 6| November 2019| Pages 1956-1966
https://doi.org/10.1107/S1600577519012268
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