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Figure 8
Cr surface roughness versus thickness measured with a micro-interferometer (blue dots) and deduced from XRR (red dots). Solid lines are linear fits to the data.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 26| Part 6| November 2019| Pages 1872-1878
https://doi.org/10.1107/S1600577519012256
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