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Figure 2
Top: principle setup of the novel SRXM device. The working principle of the central beam stop is only illustrated for third-order diffraction. Bottom: photograph of the microscope unit of the instrument.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 26| Part 6| November 2019| Pages 2040-2049
https://doi.org/10.1107/S1600577519012219
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