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Figure 6
Left: SRXM micrograph recorded in T-MOKE mode of the magnetized sample K1. The thickness of the Cr wedge of this multilayer sample decreases from the left to the right of the micrograph from 0.7 to 0.3 nm. The intensity colour scale is given on the right of the micrograph. Right: sketch of the orientation of the magnetic easy axes and the magnetization directions in the Fe surface (blue) and Fe buried (green) layer of the sample using approximately the same x-axis as the micrograph on the left.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 26| Part 6| November 2019| Pages 2040-2049
https://doi.org/10.1107/S1600577519012219
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